Measurement of Dynamic On-State Resistance of High-Voltage GaN-HEMTs under Real Application Conditions
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9205178/9215566/09215744.pdf?arnumber=9215744
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Review of GaN HEMT Dynamic ON-Resistance and Dynamic Stress Effects on Field Distribution;IEEE Transactions on Power Electronics;2024-01
2. Cost-Effective Test Setup for Measuring Threshold Voltage Shift of GaN-HEMTs under Long-Term Drain-Voltage Stress;2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA);2023-12-04
3. Variable Switching Frequency DPWM for ZVS in AC Motor Drive Fed by Two Paralleled SiC Inverters With Coupled Inductors;IEEE Transactions on Power Electronics;2023
4. Evaluation and Comparison of Dynamic ON-state Resistance Measurement Methods for GaN Devices;2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia);2022-05-15
5. A Fast ON-State Voltage Measurement Circuit for Power Devices Characterization;IEEE Transactions on Power Electronics;2022-05
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