Characterization of Microwave Substrates for High Accuracy and Long-Term Stability Using Full-Wave Microstrip Ring Resonator Method-Reference-Cited by-同舟云学术

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Characterization of Microwave Substrates for High Accuracy and Long-Term Stability Using Full-Wave Microstrip Ring Resonator Method

Published:2022-04-04 Issue: Volume: Page:
ISSN:
Container-title:2021 51st European Microwave Conference (EuMC)
language:
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Author:

Su Yuanyan¹,Pellaton Matthieu²,Affolderbach Christoph²,Mileti Gaetano²,Veljovic Miroslav¹,Skrivervik Anja¹

Affiliation:

1. Ecole Polytechnique Fédérale de Lausanne,Microwave and Antenna Group (MAG),Switzerland

2. University of Neuchâtel,Laboratoire Temps-Frequence,Switzerland

Funder

European Space Agency (ESA) project

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9784154/9783612/09784190.pdf?arnumber=9784190

Reference5 articles.

1. Determination of dielectric constant and dissipation factor of a printed circuit board material using a microstrip ring resonator structure

2. A new method to measure dielectric constant and dissipation factor of printed circuit board laminate material in function of temperature and frequency

3. Evaluation of Dielectric Properties of Printed Wiring Board Materials by Using a Microstrip-ring and Strip-line Ring Resonator Methods

4. Dielectric characterization of printed wiring board materials using ring resonator techniques: a comparison of calculation models

5. Dielectric and conductor-loss characterization and measurements on electronic packaging materials

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