Robust Inverse Design of Microwave Limiter Based on Feature Extraction and Noise Injection
Author:
Affiliation:
1. School of Automation, Southeast University,Wuxi,China
2. College of Advanced Interdisciplinary Studies, National University of Defense Technology,Changsha,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10249211/10249015/10249362.pdf?arnumber=10249362
Reference8 articles.
1. TCAD Augmented Machine Learning for Semiconductor Device Failure Troubleshooting and Reverse Engineering
2. Application of noise to avoid over fitting in TCAD augmented machine learning[C];raju;2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),0
3. Simulator acceleration and inverse design of fin field-effect transistors using machine learning
4. Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design
5. TCAD-Machine Learning Framework for Device Variation and Operating Temperature Analysis With Experimental Demonstration
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