A New Method of Producing Scattering Dilution Materials for Highly Scattering Samples by FT-IR Spectroscopy-Reference-Cited by-同舟云学术

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A New Method of Producing Scattering Dilution Materials for Highly Scattering Samples by FT-IR Spectroscopy

Published:1990-05 Issue:4 Volume:44 Page:744-746
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Kaihara Mikio¹,Mametsuka Hiroaki¹,Gunji Naoki¹,Gohshi Yohichi¹

Affiliation:

1. Analysis Research Department, Advanced Technology Research Center, NKK Corporation (Nippon Rokan), 1-1, Minamiwatarida-cho, Kawasaki-ku, Kawasaki 210, Japan (M.K., H.M., N.G.); and Industrial Chemistry, Faculty of Engineering, University of Tokyo, 7-3-1, Hongo, Bunkyo-ku, Tokyo 213, Japan (Y.G.)

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/0003702904087208

Reference5 articles.

1. Background Reduction in IR Spectroscopy Using a Highly Scattering Filter

2. A Method for Background Reduction in IR Spectroscopy

3. New Dilution Materials for Sensitivity Enhancement in the FT-IR Spectroscopy of Pitches as Typical Highly Scattering Samples

4. New accessory for strongly scattering samples in Fourier‐transform infrared spectroscopy

5. Diffuse reflectance measurements by infrared Fourier transform spectrometry

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Generality of the scattering dilution method for FT-IR spectrometry;Spectrochimica Acta Part B: Atomic Spectroscopy;1999-01

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