Step Scan Interferometry in the Mid-Infrared with Photothermal Detection-Reference-Cited by-同舟云学术

Step Scan Interferometry in the Mid-Infrared with Photothermal Detection

Published:1988-05 Issue:4 Volume:42 Page:546-555
ISSN:0003-7028
Container-title:Applied Spectroscopy
language:en
Short-container-title:Appl Spectrosc

Author:

Smith Matthew J.¹,Manning Christopher J.¹,Palmer Richard A.¹,Chao James L.¹

Affiliation:

1. Department of Chemistry, P. M. Gross Chemical Laboratory, Duke University, Durham, North Carolina 27706 (M.J.S., C.J.M., R.A.P.); and IBM Corporation, Research Triangle Park, North Carolina 27709 (J.L.C.)

Abstract

A medium resolution mid-infrared FT-IR instrument (IBM Instruments IR 44) has been modified to do step scanning; this has been done with the use of concepts previously applied to both near- and far-infrared instruments. In this paper we illustrate the method used for driving the mirror in the step scan mode and present some preliminary results from using the instrument with photothermal detection. At the current state of development, results obtained with the use of phase modulation indicate that this method produces significantly higher signal-to-noise ratios than does the use of amplitude (chopper) modulation to generate the photothermal signal.

Publisher

SAGE Publications

Subject

Spectroscopy,Instrumentation

Link

http://journals.sagepub.com/doi/pdf/10.1366/0003702884429184

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