New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines

Abstract

The least square method and corresponding computing programs for separating twofold broadening effects due to the crystallite-microstress, crystallite-stacking faults, microstress-stacking faults and three-fold effect of crystallite-stress-faults have been proposed and established. The least square method can be applied to closed packing hexagonal (cph), face-centered cubic (fcc) and body-centered cubic (bcc) structures. A few examples are presented and discussed.