Author:
EMEGHA Joseph Onyeka,OKAFOR Chukwudi Mcdonald,UKHUREBOR Kingsley Eghonghon
Abstract
Thin films of copper-zinc sulphide (CxZn1-xS) have been deposited by metal-organic chemical vapour deposition (MOCVD) technique at 400 °C on soda-lime substrates. The films contained copper dithiocarbamate and zinc dithiocarbamate of various concentrations. The effect of the precursor’s concentration was investigated using Fourier transforms infrared (FTIR) spectroscopy and UV-Vis Spectrophotometer. The precursors’ FTIR spectrums have the characteristics of copper sulphide and zinc sulphide absorption bands below 800 cm-1. The optical properties for all the samples were studied by reading the absorbance and transmittance spectra in the range of 300 - 900 nm. The results indicate direct bandgap energy that ranged between 2.20 to 3.42 eV. The films were found to have a very high transmittance in the visible and near-infrared regions and an average reflectance of about 0.14 in the same regions. Optical constants like refractive index, extinction coefficient, and optical conductivity were estimated as a function of photon energy. The various properties exhibited by the films indicate that the films can find application in various optoelectronic devices.
Publisher
College of Graduate Studies, Walailak University
Cited by
3 articles.
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