Investigation of Dielectric Properties of Ni/n-TiO2/p-Si/Al Heterojunction in Wide Range of Temperature and Voltage
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Publisher
International Digital Organization for Scientific Information (IDOSI)
Subject
General Engineering
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Voltage-frequency dependence of the complex dielectric and electric modulus and the determination of the interface-state density distribution from the capacitance-frequency measurements of Al/p-Si/Al and Al/V2O5/p-Si/Al structures;Applied Physics A;2024-08-21
2. High-temperature sensitivity complex dielectric/electric modulus, loss tangent, and AC conductivity in Au/(S:DLC)/p-Si (MIS) structures;Journal of Materials Science: Materials in Electronics;2024-01
3. Investigation and Analysis of Dual Metal Gate Overlap on Drain Side Tunneling Field Effect Transistor with Spacer in 10nm Node;International Journal of Engineering;2024
4. Dielectric, Conductivity and Modulus Properties of Au/ZnO/p-InP (MOS) Capacitor;ECS Journal of Solid State Science and Technology;2023-03-01
5. Synthesis of Silica Nanoparticles from Silica Sand via Vibration Assisted Alkaline Solution Method;International Journal of Engineering;2022
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