Author:
Almlöf Jonas,Vall Llosera Gemma,Arvidsson Elisabet,Björk Gunnar
Abstract
AbstractWe present a new test of non-randomness that tests both the lower and the upper critical limit of a $\chi ^{2}$
χ
2
-statistic. While checking the upper critical value has been employed by other tests, we argue that also the lower critical value should be examined for non-randomness. To this end, we prepare a binary sequence where all possible bit strings of a certain length occurs the same number of times and demonstrate that such sequences pass a well-known suite of tests for non-randomness. We show that such sequences can be compressed, and therefore are somewhat predictable and thus not fully random. The presented test can detect such non-randomness, and its novelty rests on analysing fixed-length bit string frequencies that lie closer to the a priori probabilities than could be expected by chance alone.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Control and Systems Engineering
Cited by
6 articles.
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