Evaluation of CCD cameras for beam profile monitoring with high intensity particle beams traversing gases

Author:

Hampf Raphael,Ulrich Andreas,Wieser Jochen

Funder

Bundesministerium f?r Bildung und Forschung

Maier-Leibnitz-Laboratorium, Garching

GSI Helmholtzzentrum f?r Schwerionenforschung GmbH

Publisher

Springer Science and Business Media LLC

Subject

Instrumentation

Reference16 articles.

1. Varentsov D, et al. (2008) Transverse Optical Diagnostics for Intense Focused Heavy Ion Beams. Contrib Plasma Phys 48:586.

2. Forck P (2010) Minimal invasive beam profile monitors for high intense hadron beams In: Conf. Proc. IPAC, 1261.. JACOW Publishing, Kyoto.

3. Becker F, et al. (2012) Beam induced fluorescence - profile monitoring for targets and transport In: Conf. Proc. of HB, 798.. JACOW Publishing, Beijing.

4. Andre C, et al. (2014) Optimization of beam induced fluorescence monitors for profile measurements of high current heavy ion beams at GSI In: Conf. Proc. IBIC, 412.. JACOW Publishing, Monterey.

5. Udrea S, et al. (2017) Development of a fluorescence based gas sheet profile monitor for use with electron lenses: optical system design and preparatory experiments In: Conf. Proc. IBIC, 359.. JACOW Publishing, Grand Rapids.

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