Multiple origins of extra electron diffractions in fcc metals

Author:

Walsh Flynn1ORCID,Zhang Mingwei1234ORCID,Ritchie Robert O.13ORCID,Asta Mark13ORCID,Minor Andrew M.123ORCID

Affiliation:

1. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.

2. National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.

3. Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, USA.

4. Department of Materials Science and Engineering, University of California, Davis, Davis, CA, USA.

Abstract

Diffuse intensities in the electron diffraction patterns of concentrated face-centered cubic solid solutions have been widely attributed to chemical short-range order, although this connection has been recently questioned. This article explores the many nonordering origins of commonly reported features using a combination of experimental electron microscopy and multislice diffraction simulations, which suggest that diffuse intensities largely represent thermal and static displacement scattering. A number of observations may reflect additional contributions from planar defects, surface terminations incommensurate with bulk periodicity, or weaker dynamical effects.

Publisher

American Association for the Advancement of Science (AAAS)

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