Field-Induced Nanometer- to Atomic-Scale Manipulation of Silicon Surfaces with the STM
Author:
Affiliation:
1. IBM Research Division, T. J. Watson Research Center, Yorktown Heights, NY 10598
Publisher
American Association for the Advancement of Science (AAAS)
Subject
Multidisciplinary
Reference18 articles.
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3. BINNIG, G, PHYSICAL REVIEW LETTERS 49: 57 (1982).
4. BINNIG, G, SCANNING TUNNELING MICROSCOPY, SURFACE SCIENCE 126: 236 (1983).
5. PHYSICAL REVIEW B 1989 40
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