Dynamics of high-speed electrical tree growth in electron-irradiated polymethyl methacrylate

Author:

Sturge Kathryn M.1,Hoppis Noah1,Bussio Ariana M.1,Barney Jonathan2,Beaudoin Brian1,Brown Cameron2,Carlsten Bruce2,Chun Carolyn1,Clifford Bryson C.1,Cumings John1,Dallmann Nicholas2,Fitzgibbon Jack1,Frashure Emily H.1,Hammell Ashley E.1,Hannan José1,Henderson Samuel L.2,Hiebert Miriam E.1,Krutzler James1,Lichthardt Joseph2,Marr-Lyon Mark2,Montano Thomas1,Moody Nathan2,Mueller Alexander2,O’Shea Patrick1,Schneider Ryan1,Smith Karl2,Tappan Bryce2,Tiemann Clayton2,Walter David2,Koeth Timothy W.1

Affiliation:

1. Department of Materials Science and Engineering, University of Maryland, College Park, College Park, MD 20742, USA.

2. Los Alamos National Laboratory, Los Alamos, NM 87545, USA.

Abstract

Dielectric materials are foundational to our modern-day communications, defense, and commerce needs. Although dielectric breakdown is a primary cause of failure of these systems, we do not fully understand this process. We analyzed the dielectric breakdown channel propagation dynamics of two distinct types of electrical trees. One type of these electrical trees has not been formally classified. We observed the propagation speed of this electrical tree type to exceed 10 million meters per second. These results identify substantial gaps in the understanding of dielectric breakdown, and filling these gaps is paramount to the design and engineering of dielectric materials that are less susceptible to electrostatic discharge failure.

Publisher

American Association for the Advancement of Science (AAAS)

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