Raman spectroscopy of optical properties in CdS thin films-Reference-Cited by-同舟云学术

Raman spectroscopy of optical properties in CdS thin films

Published:2015 Issue:2 Volume:47 Page:145-152
ISSN:0350-820X
Container-title:Science of Sintering
language:en
Short-container-title:SCI SINTER

Author:

Trajic J.¹,Gilic M.¹,Romcevic N.¹,Romcevic M.¹,Stanisic G.¹,Hadzic B.¹,Petrovic M.¹,Yahia Y.S.²

Affiliation:

1. Institute of Physics, Belgrade

2. Ain Shams University, Faculty of Education, Department of Physics, Nano-Science& Semiconductor Labs., Roxy, Cairo, Egypt

Abstract

Properties of CdS thin films were investigated applying atomic force microscopy (AFM) and Raman spectroscopy. CdS thin films were prepared by using thermal evaporation technique under base pressure 2 x 10-5 torr. The quality of these films was investigated by AFM spectroscopy. We apply Raman scattering to investigate optical properties of CdS thin films, and reveal existence of surface optical phonon (SOP) mode at 297 cm-1. Effective permittivity of mixture were modeled by Maxwell - Garnet approximation.

Funder

Ministry of Education, Science and Technological Development of the Republic of Serbia

Publisher

National Library of Serbia

Subject

Materials Chemistry,Metals and Alloys,Condensed Matter Physics,Ceramics and Composites

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