Reliability of computer memories in radiation environment-Reference-Cited by-同舟云学术

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Reliability of computer memories in radiation environment

Published:2016 Issue:3 Volume:31 Page:240-246
ISSN:1451-3994
Container-title:Nuclear Technology and Radiation Protection
language:en
Short-container-title:NUCL TECH RAD PROT

Author:

Fetahovic Irfan¹,Dolicanin Edin¹,Loncar Boris²,Kartalovic Nenad³

Affiliation:

1. State University of Novi Pazar, Novi Pazar

2. Faculty of Technology and Metallurgy, Belgrade

3. Institute of Electrical Engineering “Nikola Tesla”, Belgrade

Abstract

The aim of this paper is examining a radiation hardness of the magnetic (Toshiba MK4007 GAL) and semiconductor (AT 27C010 EPROM and AT 28C010 EEPROM) computer memories in the field of radiation. Magnetic memories have been examined in the field of neutron radiation, and semiconductor memories in the field of gamma radiation. The obtained results have shown a high radiation hardness of magnetic memories. On the other side, it has been shown that semiconductor memories are significantly more sensitive and a radiation can lead to an important damage of their functionality.

Funder

Ministry of Education, Science and Technological Development of the Republic of Serbia

Publisher

National Library of Serbia

Subject

Safety, Risk, Reliability and Quality,Nuclear Energy and Engineering

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Response of GAFChromic® HD-V2 film dosimeter in 10-300 Gy dose range for radiation testing of electronic devices;Nuclear Technology and Radiation Protection;2019

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