Analysis of image distortion on projection electron microscope image-Reference-Cited by-同舟云学术

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Analysis of image distortion on projection electron microscope image

Published:2014-10-09 Issue:11 Volume:53 Page:116602
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Iida Susumu,Hirano Ryoichi,Terasawa Tsuneo,Amano Tsuyoshi,Watanabe Hidehiro

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/53/i=11/a=116602/pdf

Reference31 articles.

1. Historical perspective and current trends in emission microscopy, mirror electron microscopy and low-energy electron microscopy

2. Bibliography on emission microscopy, mirror electron microscopy, low-energy electron microscopy and related techniques: 1985–1991

3. Electron optics for high throughput low energy electron microscopy

4. Mirror electron microscope for inspecting nanometer-sized defects in magnetic media

5. Observation of electron trapping along scratches on SiO2 surface in mirror electron microscope images under ultraviolet light irradiation

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