Mechanical properties of In/Si(111)-(8×2) investigated by atomic force microscopy-Reference-Cited by-同舟云学术

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Mechanical properties of In/Si(111)-(8×2) investigated by atomic force microscopy

Published:2016-11-25 Issue:1 Volume:56 Page:015701
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Iwata Kota,Yamazaki Shiro,Shiotari Akitoshi,Sugimoto Yoshiaki

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/56/i=1/a=015701/pdf

Reference44 articles.

1. Atomic Force Microscope

2. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity

3. Advances in atomic force microscopy

4. The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy

5. Chemical structure imaging of a single molecule by atomic force microscopy at room temperature

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1. Scanning Tunneling Microscopy and Spectroscopy of Semiconductor Materials;Reference Module in Materials Science and Materials Engineering;2018

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