Insulation resistance degradation mechanisms of multilayer ceramic capacitors during highly accelerated temperature and humidity stress tests
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/57/i=11S/a=11UC04/pdf
Reference30 articles.
1. Base-Metal Electrode-Multilayer Ceramic Capacitors: Past, Present and Future Perspectives
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