Study on effective MOSFET channel length extracted from gate capacitance
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/57/i=1/a=016601/pdf
Reference24 articles.
1. A New Method to Determine Effective MOSFET Channel Length
2. A new method to determine MOSFET channel length
3. Gate-voltage-dependent effective channel length and series resistance of LDD MOSFET's
4. Measuring the effective channel length of MOSFETs
5. A new 'shift and ratio' method for MOSFET channel-length extraction
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