Scanning near-field optical microscopy based phase-change optical memory-Reference-Cited by-同舟云学术

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Scanning near-field optical microscopy based phase-change optical memory

Published:2019-08-23 Issue:9 Volume:12 Page:095002
ISSN:1882-0778
Container-title:Applied Physics Express
language:
Short-container-title:Appl. Phys. Express

Author:

Wang Lei,Yu Lei,Wu Jia-Zhou,Wen Jing,Xiong Bang-Shu

Funder

Foundation of Jiangxi Education Department

National Natural Science Foundation of China

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

Link

http://iopscience.iop.org/article/10.7567/1882-0786/ab37aa/pdf

Reference32 articles.

1. Analysis of switching times statistical distributions for perpendicular magnetic memories

2. Nanomaterials for optical data storage

3. Nonvolatile Memories Based on Graphene and Related 2D Materials

4. Ultrahigh Storage Densities via the Scaling of Patterned Probe Phase-Change Memories

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optoelectronic Properties of Ultrathin Indium Tin Oxide Films: A First-Principle Study;Crystals;2020-12-30

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