Fast Formation of Conductive Material by Simultaneous Chemical Process for Infilling Through-Silicon Via
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Reference31 articles.
1. Current Status of Research and Development for Three-Dimensional Chip Stack Technology
2. Trends and opportunities of system-in-a-package and three-dimensional integration
3. Through-Silicon Via (TSV)
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3. Diffusion Barrier and Adhesion Properties of SiOxNy and SiOx Layers between Ag/Polypyrrole Composites and Si Substrates;ACS Applied Materials & Interfaces;2014-06-06
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