Research of X-ray induced single event soft errors in 45 nm SRAM-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Research of X-ray induced single event soft errors in 45 nm SRAM

Published:2018-11-27 Issue:1 Volume:58 Page:011002
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Zhang Yang,Guo Hong-Xia,Zhang Feng-Qi,Wei Jia-Nan,Liu Yan,Luo Jian-Hui,Liang Yu-Fang,Qin Li

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/58/i=1/a=011002/pdf

Reference22 articles.

1. Impact of the Radial Ionization Profile on SEE Prediction for SOI Transistors and SRAMs Beyond the 32-nm Technological Node

2. Frequency Dependence of Alpha-Particle Induced Soft Error Rates of Flip-Flops in 40-nm CMOS Technology

3. Modeling and simulation of ionizing radiation effect on ferroelectric field-effect transistor

4. Influence of Elastic Scattering on the Neutron-Induced Single-Event Upsets in a Static Random Access Memory

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of PVT variation on single-event transient effect assisted with hardened layout techniques;Japanese Journal of Applied Physics;2022-12-23

2. Influence of Assumed Strain Hardening Relation on Plastic Stress-Strain Response Identification From Conical Indentation;Journal of Engineering Materials and Technology;2020-02-07

3. Performance improvement of a p-MoS2/HfS2 van der Waals heterostructure tunneling FET by UV-O3 treatment;Applied Physics Express;2019-05-31

4. Thermionic emission of carriers in InGaN/(In)GaN multiple quantum wells;Japanese Journal of Applied Physics;2019-04-12

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3