Coaxial 2-port S-parameter system for transistor characterisation in three configurations from 1-500 MHz-Reference-Cited by-同舟云学术

Coaxial 2-port S-parameter system for transistor characterisation in three configurations from 1-500 MHz

Published:1975 Issue:9 Volume:122 Page:877
ISSN:0020-3270
Container-title:Proceedings of the Institution of Electrical Engineers
language:en
Short-container-title:Proc. Inst. Electr. Eng. UK

Author:

Granville-George D.A.,Woods D.

Publisher

Institution of Engineering and Technology (IET)

Subject

General Engineering,General Medicine

Link

https://digital-library.theiet.org/content/journals/10.1049/piee.1975.0241?crawler=true&mimetype=application/pdf

Reference24 articles.

1. Granville-George, D.: ‘The measurement of transistor and integrated circuit parameters in the frequency range 10 kHz to 100 MHz’, 1971, Ph.D. Thesis, University of Surrey

2. Granville-George, D., and Woods, D.: ‘Measurement of 2-portSparameters of transistors in three configurations up to 100 MHz’, R.F. measurements on solid-state devices, 1971),IEE Colloq. Dig. 71/13, paper 3

3. Woods, D.: ‘Review of methods for the characterisation of active devices in terms of 2-port and 3-port parameters’, R.F. measurements on solidstate devices, 1971),IEE Colloq. Dig. 71/13, paper 1

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