Path loss models with distance‐dependent weighted fitting and estimation of censored path loss data
Author:
Affiliation:
1. Department of Electrical EngineeringUniversity of Southern CaliforniaLos AngelesCAUSA
2. Department of Electrical and Information TechnologyLund UniversityLundSweden
3. Samsung Electronics, Co., Ltd.South Korea
Funder
National Science Foundation
Samsung
Walter Ahlströmin Säätiö
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-map.2016.0042
Reference24 articles.
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