Author:
Bengtsson T.,Kumar S.,Ubar R.-J.,Jutman A.,Peng Z.
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
1 articles.
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1. Test Pattern Generation for Multiple Victim Lines of Crosstalk Effect in Digital Circuits by Binary Decision Diagram;Proceedings of the 2015 International Conference on Electrical and Information Technologies for Rail Transportation;2016