High‐frequency InAlN/GaN HFET with f max over 400 GHz

Author:

Fu Xing‐Chang12,Lv Yuanjie3,Zhang Li‐Jiang12,Zhang Tong1,Li Xian‐Jie1,Song Xubo2,Zhang Zhirong2,Fang Yulong3,Feng Zhihong3

Affiliation:

1. Joint International Research Laboratory of Information Display and Visualization, School of Electronic Science and Engineering, Southeast UniversityNanjing210096People's Republic of China

2. Hebei Semiconductor Research Institute, Shijiazhuang, 050051People's Republic of China

3. National Key Laboratory of Application Specific Integrated Circuit (ASIC)Shijiazhuang050051People's Republic of China

Funder

Ministry of Science and Technology of the People's Republic of China

National Natural Science Foundation of China

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Pulsed sputtering selective epitaxial formation of highly degenerate n-type GaN ohmic contacts for GaN HEMT applications;Applied Physics Express;2024-01-01

2. Advanced Down-Scaling Technology and its Physical Mechanism for 515 GHz GaN HEMT;2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS);2023-11-27

3. Demonstration of 420GHz highly scaled InAlN/GaN HEMTs by Electron Beam Lithography;2023 International Workshop on Advanced Patterning Solutions (IWAPS);2023-10-26

4. Scaled InAlN/GaN HEMT on Sapphire With fT/fmax of 190/301 GHz;IEEE Transactions on Electron Devices;2023-06

5. Effects of growth temperature on structural and electrical properties of in-rich InAlN–GaN heterostructures by radio-frequency metal–organic molecular beam epitaxy;Surface Topography: Metrology and Properties;2023-04-27

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