Ultra‐energy‐efficient temperature‐stable physical unclonable function in 65 nm CMOS
Author:
Affiliation:
1. School of ICTKTH Royal Institute of TechnologyKista16440StockholmSweden
Funder
Stiftelsen för Strategisk Forskning
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/el.2016.0292
Reference5 articles.
1. Zero bit error rate ID generation circuit using via formation probability in 0.18 μm CMOS process;Choi B.D.;Electron. Lett.,2014
2. CMOS Silicon Physical Unclonable Functions Based on Intrinsic Process Variability
3. A 10-bit Charge-Redistribution ADC Consuming 1.9 $\mu$W at 1 MS/s
4. Intelligent voltage ramp‐up time adaptation for temperature noise reduction on memory‐based PUF systems;Cortez M.;IEEE Trans. Comput. Des. Integr. Circuits Syst.,2015
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