Unknown defect detection for printed circuit board based on multi‐scale deep similarity measure method
Author:
Affiliation:
1. Key Laboratory of Machine Perception, Peking University, Shenzhen Graduate SchoolPeople's Republic of China
2. Shenzhen Skyworth‐RGB Electronic, CO., LTD.ShenzhenPeople's Republic of China
Publisher
Institution of Engineering and Technology (IET)
Subject
General Engineering,Energy Engineering and Power Technology,Software
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/joe.2019.1188
Reference40 articles.
1. Automatic PCB inspection algorithms: a survey;Moganti M.;Comput. Vis. Image Underst.,1996
2. GuoF. GuanS.: ‘Research of the machine vision based PCB defect inspection system’.Proc. Int. Conf. on Intelligence Science and Information Engineering Wuhan China August 2011 pp.472–475
3. Automated inspection of printed circuit boards through machine vision;Wu W.Y.;Comput. Ind.,,1996
4. PuteraS.H.I. DzafaruddinS.F. MohamadM.: ‘MATLAB based defect detection and classification of printed circuit board’.Proc. Int. Conf. on Digital Information and Communication Technology and it's Applications Bangkok Thailand May 2012 pp.115–119
5. RenS. LuL. ZhaoL.et al.: ‘Circuit board defect detection based on image processing’.Proc. Int. Congress on Image and Signal Processing (CISP) Shenyang China October 2015 pp.899–903
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Enhancing YOLOv5 for superior PCB defect detection: lightweight heads and small target precision;Journal of Physics: Conference Series;2024-07-01
2. DSASPP: Depthwise Separable Atrous Spatial Pyramid Pooling for PCB Surface Defect Detection;Electronics;2024-04-14
3. Deep Learning-Based Integrated Circuit Surface Defect Detection: Addressing Information Density Imbalance for Industrial Application;International Journal of Computational Intelligence Systems;2024-02-14
4. A PCB Defect Detection Algorithm Based on Improved Yolov7-tiny;2023 IEEE 5th International Conference on Civil Aviation Safety and Information Technology (ICCASIT);2023-10-11
5. LDDNet: Lightweight Defect Detection Network based on Mixed Supervision;2023 6th International Conference on Artificial Intelligence and Pattern Recognition (AIPR);2023-09-22
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3