Probabilistic evaluation of failure risk of transmission line surge arresters caused by lightning flash-Reference-Cited by-同舟云学术

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Probabilistic evaluation of failure risk of transmission line surge arresters caused by lightning flash

Published:2014-02 Issue:2 Volume:8 Page:193-202
ISSN:1751-8695
Container-title:IET Generation, Transmission & Distribution
language:en
Short-container-title:IET Generation, Transmission & Distribution

Author:

Shariatinasab Reza¹,Ajri Farid¹,Daman‐Khorshid Hadiseh¹

Affiliation:

1. Electrical and Computer Engineering DepartmentUniversity of BirjandBirjand97175/376Iran

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology,Control and Systems Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-gtd.2013.0280

Reference19 articles.

1. Insulation Coordination for Power Systems

2. Lightning Performance Analysis of Overhead Transmission Lines Using the EMTP

3. Probabilistic Evaluation of Optimal Location of Surge Arresters on EHV and UHV Networks Due to Switching and Lightning Surges

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1. Electrothermal characteristics of zinc oxide varistors with different aging states after multiple lightning strikes based on Voronoi network finite element model;Electric Power Systems Research;2024-04

2. Performance evaluation of distribution and low-voltage networks under direct lightning flashes with paralleled triac-surge arrester;Electric Power Systems Research;2023-12

3. An Impulse Aging Assessment Method for Arrester Under Multiple Strokes Based on Frequency Domain Dielectric Spectroscopy;IEEE Transactions on Power Delivery;2023-08

4. Performance Analysis of Double Arrester Protection Configuration of Pole Mounted Transformers using Probabilistic Risk Evaluation;2023 IEEE Electrical Insulation Conference (EIC);2023-06-18

5. An Assessment of Failure Rate of Pole-Mounted Transformers Using Probabilistic Risk Evaluation of Lightning Arresters;IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society;2022-10-17

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