Experiment on Ka‐band amplifiers degraded and damaged by electromagnetic waves-Reference-Cited by-同舟云学术

Experiment on Ka‐band amplifiers degraded and damaged by electromagnetic waves

Published:2018-01 Issue:14 Volume:2018 Page:704-708
ISSN:2051-3305
Container-title:The Journal of Engineering
language:en
Short-container-title:J. eng.

Author:

Wang Zhan‐Liang¹²,Luo Jinjin¹,Xiong Xu²,Gong Yu‐Bin¹,Wei Yan‐Yu¹,Duan Zhao‐Yun¹,Gong Huarong¹

Affiliation:

1. School of Electronics Science and Engineering, University Electronic Science and Technology of China (UESTC)No. 4, Section 2, North Jianshe RoadChengduPeople's Republic of China

2. State Key Laboratory of Complex Electromagnetic Environment Effects of Electronics and Information SystemLuoyang 471003People's Republic of China

Funder

National Natural Science Foundation of China

Publisher

Institution of Engineering and Technology (IET)

Subject

General Engineering,Energy Engineering and Power Technology,Software

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/joe.2018.0098

Reference16 articles.

1. HaiYangW.: ‘Theoretical and experimental research on HPM effection’ Doctorate University of Electronic Science and Technology of China Chengdu 2010

2. Electromagnetic pulse functional damage of semiconductor devices modeled using temperature gradients as boundary conditions;Dobykin V.D;J. Commun. Technol. Electron. (Russia),2016

3. Complete characterization of novel MHMICs for V band communication systems;Hannachi C.;J. Electr. Comput. Eng.,2013

4. Strategic control of 60 GHz millimeter wave high speed wireless links for distributed virtual reality platforms;Joongheon K.;Mobile Inf. Syst.,2017

5. A novel terahertz rat‐race hybrid coupler based on PPDW;Yang X.;J. Infrared, Millim. Terahertz Waves (JIMTW),2011

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