Conduction mechanisms in metal/self‐assembled monolayer/metal junctions-Reference-Cited by-同舟云学术

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Conduction mechanisms in metal/self‐assembled monolayer/metal junctions

Published:2019-06 Issue:7 Volume:14 Page:808-811
ISSN:1750-0443
Container-title:Micro & Nano Letters
language:en
Short-container-title:Micro & Nano Letters

Author:

Etor David¹²^ORCID,Dodd Linzi E.¹³^ORCID,Balocco Claudio¹,Wood David¹³

Affiliation:

1. Department of EngineeringDurham UniversityDurhamDH1 3LEUK

2. Department of Electrical and Computer EngineeringBaze UniversityAbuja900108Nigeria

3. Department of Mathematics, Physics and Electrical EngineeringNorthumbria UniversityNewcastle upon TyneNE1 8STUK

Funder

Petroleum Technology Development Fund

Publisher

Institution of Engineering and Technology (IET)

Subject

Condensed Matter Physics,General Materials Science,Biomedical Engineering,Bioengineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/mnl.2018.5747

Reference18 articles.

1. Efficient waveguide-integrated tunnel junction detectors at 1.6 μm

2. Conduction processes in metal–insulator–metal diodes with Ta2O5 and Nb2O5 insulators deposited by atomic layer deposition;Alimardani N.;J. Vac. Sci. Technol.,2014

3. Characteristics of tungsten‐nickel point contact ‐diodes used as laser harmonic‐generator mixers;Sakuma E.;IEEE J. Quant. Electron.,1974

4. ABSOLUTE FREQUENCY MEASUREMENTS OF THE 28‐ AND 78‐μm cw WATER VAPOR LASER LINES

5. Tunable far‐infrared spectroscopy

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