All-optical discrimination at 1.5 [micro sign]m using an ultrafast saturable absorber vertical cavity device-Reference-Cited by-同舟云学术

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All-optical discrimination at 1.5 [micro sign]m using an ultrafast saturable absorber vertical cavity device

Published:2000 Issue:17 Volume:36 Page:1486
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:Electron. Lett.

Author:

Mangeney J.,Aubin G.,Oudar J.L.,Harmand J.C.,Patriarche G.,Choumane H.,Stelmakh N.,Lourtioz J.M.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://digital-library.theiet.org/content/journals/10.1049/el_20001056?crawler=true&mimetype=application/pdf

Reference7 articles.

1. Use of fast in-line saturable absorbers in wavelength-division-multiplexed soliton systems

2. Ultrafast dynamics of nonlinear absorption in low‐temperature‐grown GaAs

3. 10 Gbit/s RZ all-optical discrimination using refined saturable absorber optical gate

4. Ultrafast excitonic saturable absorption in ion-implanted InGaAs/InAlAs multiple quantum wells

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3. Impact of signal filling factor for switching in reflective vertical cavity-based fast semiconductor saturable absorbers;Journal of Modern Optics;2016-07-13

4. Giant optical nonlinearity induced by a single two-level system interacting with a cavity in the Purcell regime;Physical Review A;2007-05-30

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