Author:
Faist J.,Morier-Genoud F.,Martin D.,Ganiere J.D.,Reinhart F.-K.
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Reference7 articles.
1. The sample has been examined using a method described in more detail in Reference 6. A small piece of the sample is cleaved and examined parallel to the grown layers using transmission microscopy through the cleaved edge
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