Stability improvement of amorphous InGaZnO TFTs by an asymmetric design
Author:
Affiliation:
1. National Yunlin University of Science and TechnologyDouliu64002Taiwan
Funder
Ministry of Science and Technology
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/el.2015.2036
Reference15 articles.
1. Active-Matrix Amorphous-Silicon TFTs Arrays at 180$^circhboxC$on Clear Plastic and Glass Substrates for Organic Light-Emitting Displays
2. Low Temperature Annealing with Solid-State Laser or UV Lamp Irradiation on Amorphous IGZO Thin-Film Transistors
3. Characterizations of Amorphous IGZO Thin-Film Transistors With Low Subthreshold Swing
4. Influence of extended bias stress on the electrical parameters of mixed oxide thin film transistors;Winnie R.N.P.V.;Circuits Syst.,2012
5. Review of Present Reliability Challenges in Amorphous In-Ga-Zn-O Thin Film Transistors
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Improving the electrical stability of a‐IGZO TFT through gate surround structures;Electronics Letters;2023-10
2. Deep UV Sensors Enabling Solar-Blind Flame Detectors for Large-Area Applications;IEEE Sensors Journal;2021-07-01
3. Thin‐Film Devices for Active Pixel Sensor Schemes Enabling High Density and Large‐Area Sensors;Advanced Materials Technologies;2021-06-26
4. Design of a voltage‐programmed V TH compensating pixel circuit for AMOLED displays using diode‐connected a‐IGZO TFT;IET Circuits, Devices & Systems;2020-09
5. Integrated Thin-Film Radiation Detectors and In-Pixel Amplification;IEEE Transactions on Electron Devices;2018-09
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3