Stress test of lithographic vertical‐cavity surface‐emitting lasers under extreme operating conditions
Author:
Affiliation:
1. College of Optics and PhotonicsCREOLUniversity of Central FloridaOrlandoFL32816USA
2. sdPhotonics, LLCOviedoFLUSA
Funder
Army Research Office
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/el.2015.1385
Reference10 articles.
1. Native‐oxide defined ring contact for low threshold vertical‐cavity lasers
2. Oxide-confined 850 nm VCSELs operating at bit rates up to 40 Gbit/s
3. 40 Gbit/s error-free operation of oxide-confined 850 nm VCSEL
4. Small oxide‐free vertical‐cavity surface‐emitting lasers with high efficiency and high power
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