Simplified calculations of the lateral distribution for the current in tunnelling junctions having general shapes
Author:
Affiliation:
1. NewPath Research L.L.C.2880 S. Main Street, Suite, 214Salt Lake CityUtah84115USA
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/el.2015.3671
Reference8 articles.
1. Simulation of current in the scanning tunneling microscope
2. Green‐function theory of scanning tunnelling microscopy: tunnel current and current density for clean metal surfaces;Doyen G.;Phys. Rev. B,1993
3. Tunneling current density within Tersoff and Hamann's theory of the scanning tunnelling microscope;Leavens C.R.;Phys. Rev. B,1988
4. Observation of 200th harmonic with fractional linewidth of 10−10 in a microwave frequency comb generated in a tunnelling junction;Hagmann M.J.;Appl. Phys. Lett.,2012
5. Possible applications of scanning frequency comb microscopy for carrier profiling in semiconductors;Hagmann M.J.;J. Vac. Sci. Technol. B,2015
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