MMIC yield optimisation by design centring and off-chip controllers
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/ip-cds_20040788?crawler=true&mimetype=application/pdf
Reference13 articles.
1. Physical mechanisms limiting the manufacturing uniformity of millimeter-wave power InP HEMT's
2. A monolithic DC temperature compensation bias scheme for multistage HEMT integrated circuits
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