The Impact of Cu Interlayer Thickness on the Structure and Optical Duality of Tio2 /Cu/Tio2 Trilayer Thin Film For Photocatalystic Applications-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

The Impact of Cu Interlayer Thickness on the Structure and Optical Duality of Tio2 /Cu/Tio2 Trilayer Thin Film For Photocatalystic Applications

Published:2022 Issue: Volume: Page:
ISSN:1556-5068
Container-title:SSRN Electronic Journal
language:en
Short-container-title:SSRN Journal

Author:

diab mohamed,Negm S.,Fouad S.S.,Baradács Eszter,Parditka Bence,Erdélyi Zoltán

Publisher

Elsevier BV

Subject

General Earth and Planetary Sciences,General Environmental Science

Reference31 articles.

1. Enhancement of dispersion optical parameters of Al 2 O 3 /ZnO thin films fabricated by ALD;Hanaa;Solar Energy,2020

2. Robust TiN nanoparticles polysulfide anchor for Li-S storage and diffusion pathways using first principle calculations;Shahid;Chemical Engineering Journal,2020

3. Preparation and characterization of XRD nano Cu-TiO 2 using sol-gel method;Arizka Tamarani;Journal of Physics: Conference Series,2019

4. Synthesis and characterization of Cu-doped TiO 2 thin films produced by the inert gas condensation technique;H A Ahmed;Journal of Physics: Conference Series,2017

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP