Microstructure Evolutions Induced by Electron Beam Melting of a Sintered Cu-25Cr Composite
Author:
Publisher
Elsevier BV
Reference36 articles.
1. Review of the recent Chinese research on the electrical properties of CuCr contacts for vacuum interrupters;J Han;Journal of Materials Research and Technology,2023
2. Influence of microstructure on dielectric strength of CuCr contact materials in a vacuum;B Ding;IEEE Transactions on Components Packaging and Manufacturing Technology Part A,1996
3. The Influence of Composition and Cr Particle Size of Cu/Cr Contacts on Chopping Current, Contact Resistance, and Breakdown Voltage in Vacuum Interrupters;W F Rieder;IEEE Transactions on Components, Hybrids, and Manufacturing Technology,1989
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