Stripe TEM as a method of calculating chemical profiles across interfaces between solids or core-shell structures using electron energy-loss spectroscopic profiling-Reference-Cited by-同舟云学术

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Stripe TEM as a method of calculating chemical profiles across interfaces between solids or core-shell structures using electron energy-loss spectroscopic profiling

Published:2005-05 Issue:5 Volume:96 Page:429-437
ISSN:0044-3093
Container-title:Zeitschrift für Metallkunde
language:en
Short-container-title:MEKU

Author:

Walther Thomas

Publisher

Walter de Gruyter GmbH

Subject

Metals and Alloys

Reference43 articles.

1. Introduction to Analytical Electron Microscopy

2. Electron Energy-Loss Spectroscopy in the Electron Microscope

3. Elemental imaging and resolution in energy-filtered conventional electron microscopy

4. EELS elemental mapping with unconventional methods II. Applications to biological specimens

5. The use of low-cost frame grabber boards on PC-AT computers for ESI: possibilities and limitations

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3. Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide;International Journal of Materials Research;2006-07-01

4. Quantitative microstructural and spectroscopic investigation of inversion domain boundaries in sintered zinc oxide ceramics doped with iron oxide;International Journal of Materials Research;2006-07

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