A Comparison of Grain Quantitative Evaluation Performed with Standard Method of Imaging with Light Microscopy and EBSD Analysis
Author:
Affiliation:
1. Department of Materials Science, Silesian University of Technology, Krasińnskiego 8, 40-019 Katowice, Poland
Abstract
Publisher
Walter de Gruyter GmbH
Subject
Metals and Alloys,Mechanics of Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
https://www.degruyter.com/document/doi/10.3139/147.110043/pdf
Reference10 articles.
1. Electron backscatter diffraction: applications for nuclear materials
2. Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscope
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