Characterization of Adsorption Properties of H2O on Si(001) and Si(111) by Ellipsometry and ab initio Molecular Orbital Calculations.
Author:
Affiliation:
1. Department of Chemical Engineering, Himeji Institute of Technology
Publisher
Society of Chemical Engineers, Japan
Subject
General Chemical Engineering,General Chemistry
Link
http://www.jstage.jst.go.jp/article/jcej/34/5/34_5_684/_pdf
Reference29 articles.
1. Azzam, R.M.A. and N.M. Bashara; Ellipsometry and Polarized Light, North-Holland, Amsterdam, the Netherlands (1977)
2. Hydride formation on the Si(100):H2O surface
3. Evidence of dissociation of water on the Si(100)2 × 1 surface
4. Si(100)-(2×1) surface defects and dissociative and nondissociative adsorption ofH2O studied with scanning tunneling microscopy
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