Investigating the effects of smoothness of interfaces on stability of probing nano-scale thin films by neutron reflectometry
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Published:2012-03
Issue:1
Volume:15
Page:13604
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ISSN:1607-324X
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Container-title:Condensed Matter Physics
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language:
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Short-container-title:Condens. Matter Phys.
Publisher
Institute for Condensed Matter Physics
Subject
Physics and Astronomy (miscellaneous),Condensed Matter Physics