System Analysis and Reliability Analysis for Environmental Test Chambers
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Published:2021-01-12
Issue:
Volume:14
Page:1115-1128
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ISSN:1998-4464
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Container-title:International Journal of Circuits, Systems and Signal Processing
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language:en
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Short-container-title:
Author:
Gu Chaoyang1, Zhai Lin1, Gu Wei1, Sun Yuyu1, Han Chengjing1, Zhou Xianwen1, Niu Wangqiang1
Affiliation:
1. Shanghai Maritime University, Shanghai, China
Abstract
The purpose of this paper is to present the results of the application of various models to estimate the reliability of environmental test chambers, especially, the methodology proposed by the International Electrotechnical Commission (IEC), using the Homogeneous Poisson process (HPP) and Non-Homogeneous Poisson process (NHPP) models, is adopted first, and then, a non-monotonic trend test and bathtub curve intensity function not covered by IEC are used, and supplementary analysis is used to characterize the resulting failure intensity. For the first time, the stochastic process model was applied to evaluate the reliability of 20 environmental test chambers. The results show that the IEC standards process is suitable for the reliability evaluation of a single chamber, and 16 chambers conform to the HPP model and 4 chambers conform to the NHPP model. However, there is the power-law model (PLP) rejection cases among the overall description of multiple chambers by the IEC model. The rejected cases were analyzed again by using a non-monotonic trend test and constructing a double Weibull process tub curve strength function, and the 3-stage time interval of the bathtub curve failure is obtained, which is in line with the actual operation data. The Ward clustering method is used for the mean time between failures of 20 chambers, resulting in 4 types of chamber groups with different reliability values (71,52,100,130 days), which is of great significance for studying the reliability of the environmental test chamber and carrying out customized maintenance.
Publisher
North Atlantic University Union (NAUN)
Subject
Electrical and Electronic Engineering,Signal Processing
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