Modeling resistance increase in a composite ink under cyclic loading

Author:

Li QORCID,Chung EORCID,Antoniou AORCID,Pierron OORCID

Abstract

Abstract The electrical performance of stretchable electronic inks degrades as they undergo cyclic deformation during use, posing a major challenge to their reliability. The experimental characterization of ink fatigue behavior can be a time-consuming process, and models allowing accurate resistance evolution and life estimates are needed. Here, a model is proposed for determining the electrical resistance evolution during cyclic loading of a screen-printed composite conductive ink. The model relies on two input specimen-characteristic curves, assumes a constant rate of normalized resistance increase for a given strain amplitude, and incorporates the effects of both mean strain and strain amplitude. The model predicts the normalized resistance evolution of a cyclic test with reasonable accuracy. The mean strain effects are secondary compared to strain amplitude, except for large strain amplitudes (>10%) and mean strains (>30%). A trace width effect is found for the fatigue behavior of 1 mm vs 2 mm wide specimens. The input specimen-characteristic curves are trace-width dependent, and the model predicts a decrease in N f by a factor of up to 2 for the narrower trace width, in agreement with the experimental results. Two different methods are investigated to generate the rate of normalized resistance increase curves: uninterrupted fatigue tests (requiring ∼6–7 cyclic tests), and a single interrupted cyclic test (requiring only one specimen tested at progressively higher strain amplitude values). The results suggest that the initial decrease in normalized resistance rate only occurs for specimens with no prior loading. The minimum-rate curve is therefore recommended for more accurate fatigue estimates.

Funder

Directorate for Engineering

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Reference30 articles.

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