Statistical investigation of the length-dependent deviations in the electrical characteristics of molecular electronic junctions fabricated using the direct metal transfer method-Reference-Cited by-同舟云学术

Statistical investigation of the length-dependent deviations in the electrical characteristics of molecular electronic junctions fabricated using the direct metal transfer method

Published:2016-02-12 Issue:9 Volume:28 Page:094003
ISSN:0953-8984
Container-title:Journal of Physics: Condensed Matter
language:
Short-container-title:J. Phys.: Condens. Matter

Author:

Jeong Hyunhak,Kim Dongku,Kwon Hyukwoo,Hwang Wang-Taek,Jang Yeonsik,Min Misook,Char Kookrin,Xiang Dong,Jeong Heejun,Lee Takhee

Funder

National Research Foundation of Korea

Publisher

IOP Publishing

Subject

Condensed Matter Physics,General Materials Science

Link

http://stacks.iop.org/0953-8984/28/i=9/a=094003/pdf

Reference47 articles.

1. Large On-Off Ratios and Negative Differential Resistance in a Molecular Electronic Device

2. Electronically Configurable Molecular-Based Logic Gates

3. Coulomb blockade and the Kondo effect in single-atom transistors

4. Electron Transport in Molecular Wire Junctions

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