Electron-stimulated athermal surface recrystallization of Si(100)
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/16/i=13/a=L04/pdf
Reference27 articles.
1. Precision, accuracy, and uncertainty in quantitative surface analyses by Auger‐electron spectroscopy and x‐ray photoelectron spectroscopy
2. Electron-Stimulated Modification of Si Surfaces
3. Electron-stimulated surface stress relaxation of Si
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3. Real-time observation of electron-stimulated effects on Si(001)-(2 × 1) by optical reflectance spectroscopic methods;Journal of Physics: Condensed Matter;2007-09-24
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