10.1088/0960-1317/5/3/005
Author:
Publisher
IOP Publishing
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
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3. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
4. Magnetic force microscope using a direct resonance frequency sensor operating in air
5. Piezoelectric Sensor for Detecting Force Gradients in Atomic Force Microscopy
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