Total-reflection high-energy positron diffraction (TRHEPD) for structure determination of the topmost and immediate sub-surface atomic layers
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://iopscience.iop.org/article/10.1088/1361-6463/aadf14/pdf
Reference101 articles.
1. Reflection High-Energy Electron Diffraction
2. Surface X-ray diffraction
3. Low-Energy Positron Diffraction from a Cu(111) Surface
4. Low-energy electron and low-energy positron holography
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