Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging-Reference-Cited by-同舟云学术

Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging

Published:2017-01-31 Issue:9 Volume:28 Page:095711
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Nellist Michael R,Chen Yikai,Mark Andreas,Gödrich Sebastian,Stelling Christian,Jiang Jingjing,Poddar Rakesh,Li Chunzeng,Kumar Ravi,Papastavrou Georg,Retsch Markus,Brunschwig Bruce S,Huang Zhuangqun,Xiang Chengxiang,Boettcher Shannon W

Funder

Division of Chemistry

Elite Network of Bavaria

Deutsche Forschungsgemeinschaft

Basic Energy Sciences

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/28/i=9/a=095711/pdf

Reference83 articles.

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